Model CPX-VF Cryogenic Probe Station

Features of the Model CPX-VF Superconducting Magnet-based Vertical Field Probe Station

  • Standard probing plus out-of-plane vertical field superconducting magnetic measurements
  • Multiple radiation shields for best low temperature performance
  • Minimize sample condensation during cool-down
  • True 90° probing
  • Customizable for Hall measurements
  • Customizable up to 3 T with specialized probes
  • THz probe arm option for precise on-wafer contact probing of millimeter wave devices at THz frequencies (75 GHz and up)

Optional configurations

Click here for detailed option descriptions

Load-lock option Load lock (PS-LL-CPX)
High vacuum option High vacuum (PS-HV-CPX)
Low temperature option Low temperature (PS-LT-CPX)
Vibration isolation option Vibration isolation (PS-PVIS)
PSoption_Z160 Zoom 125 microscope (PS-Z12P5)
CPX-VF vacuum chamber and radiation shields

The Lake Shore CPX-VF probe station enhances the standard probe station capabilities with the addition of a ±2.5 T vertical field superconducting magnet. It can do all the standard C-V, I-V, microwave, and electro-optical probing of the CPX, plus out-of-plane vertical field superconducting magnetic measurements. Researchers can use it for performing Hall effect measurements and testing magneto-transport parameters. The CPX-VF is one of Lake Shore’s premium probe stations for combining microwave measurements with magnetic field.

The CPX-VF is designed to enable true 90° wafer probing on wafers up to 51 mm (2 in) in diameter. The sample can be maintained at elevated temperature during cooldown reducing the potential for condensation, a critical requirement for measuring organic materials. The continuous refrigeration station uses liquid helium and can be operated with liquid nitrogen; however, the superconducting magnet requires liquid helium to operate. The CPX-VF operates over a temperature range of 4.2 K to 400 K with the option to extend the base temperature to 2 K.

Own a CPX-VF? Upgrade to cryogen-free!

 

Sample holders

Probing configurations

Vision system

Sample temperature accuracy is key

Download the probe station catalog
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