Lake Shore Cryotronics will showcase cryogenic probe station options for high-frequency measurements as well as material characterization systems at next week’s MRS Spring Exhibit, March 29 – 31, in Phoenix.
For early-stage material and device research, Lake Shore offers high-performance, micro-manipulated cryogenic probe stations for on-wafer DC, RF, or microwave measurements at temperatures as low as 1.6 K and in fields to over 2 T.
In Lake Shore’s MRS booth, the company will be demonstrating the interoperability of their affordable TTPX probe station with a Keysight Technologies B1500A analyzer for automated variable-temperature characterization applications, as well as the soon-to-be-released THz probe arm option. This unique contact probing solution, designed for precise on-wafer probing of millimeter wave devices at frequencies of 75 GHz and up, enables calibrated S-parameter and other high-frequency electrical measurements to be performed at cryogenic temperatures and in magnetic fields.
Lake Shore will also be discussing their:
- 8500 Series THz material characterization system for non-contact characterization of research-scale materials; the fully integrated system features a high-field cryostat enabling material spectroscopic response measurements across a wide range of frequencies, temperatures, and field strengths.
- New 7400-S Series vibrating sample magnetometer (VSM), a workhorse system that offers fields to over 3.4 T and a 4.2 K to 1273 K temperature span for characterizing a broader range of magnetic material samples.
- 8400 Series Hall effect measurement system with an AC field Hall measurement option for characterizing materials with very low mobilities, including many semiconductor and electronic materials, down to 0.001 cm2/V s.
For more information, visit MRS Spring Booth 112.