Lake Shore Cryotronics will be exhibiting platforms for material probing and characterization at the Oct. 4 – 8 Materials Science & Technology 15 (MS&T 15) conference in Columbus, OH.
Among these will be cryogenic probe stations, which enable reliable measurements of electrical, electro-optical, DC, RF, and microwave properties of materials at cryogenic temperatures and under the application of high magnetic fields. The stations are for early-phase material research when it is often necessary to measure samples in a tightly-controlled environment at temperatures below 4 K and in fields to more than 2 T.
For attendees wanting to see Lake Shore’s cryogenic probing technology up close, the company will be showcasing their popular Model TTPX probe station as well as a prototype for a new terahertz (THz) on-wafer probe arm option in MS&T Booth #806. This unique arm will enable researchers to perform high-frequency (75 GHz and up) measurements at cryogenic temperatures and in magnetic fields.
Plus for researchers interested in using THz-frequency energy for non-contact spectroscopic characterization of materials over a range of temperatures and field strengths, Lake Shore will be sharing information about their Model 8501 system. The industry’s first affordable, fully integrated system specifically tailored for characterization of research-scale materials, the Model 8501 uses a continuous wave THz spectrometer for measuring at 200 GHz to 1.5 THz frequencies and spectral resolution of better than 500 MHz at temperatures ranging from 5 K to 300 K, and in magnetic fields to 9 T.
Also at MS&T, Lake Shore Senior Scientist Brad Dodrill will be presenting during the “Advances in Polar, Magnetic and Semiconductor Materials: Extending Temperature Limits” symposium. His invited presentation, “First-Order-Reversal Curve (FORC) Analysis of Magnetic Materials at High Temperatures,” is based on recent research of his with Dr. Paul Ohodnicki of the U.S. National Energy Technology Laboratory and Dr. Cosmin Radu of Lake Shore, and will include FORC results for high-temperature measurements of magnetically hard (e.g., permanent magnet) and soft (e.g., CoFe-SiO2) materials.
Lake Shore’s MicroMag™ vibrating sample magnetometer (VSM) and alternating gradient magnetometer (AGM) systems are arguably the standard for FORC measurements because of their measurement speed. Dodrill and other Lake Shore representatives will be available to discuss these and other magnetometer systems.
Additionally, the company will be discussing Hall effect measurement systems used to perform Hall effect and magnetotransport measurements of materials, including wafer-scale materials, as a function of temperature and field.