Device and material characterization
Software for time-sensitive coordination of temperature, field, and electrical measurements for material characterization research.
Micro-manipulated probe stations used for non-destructive testing of devices on full and partial wafers. Ideal for measuring magneto-transport, electrical, electro-optical, parametric, high Z, DC, RF, and microwave properties.
The EM-V Series electromagnets produce variable magnetic fields with a variety of air gap and pole cap configurations. They are ideal for a variety of applications.
Scalable research platforms that quickly adapt to a wide range of material characterization applications.
Measure AC/DC Hall effect and AHE in spintronics, transparent oxides, DMS, and compound semiconductors. Resolve individual carrier mobilities and densities using our QMSA software package.
Measure hysteresis M(H) loops, torque curves, and temperature dependent magnetic properties of a wide range of samples including bulk, powder, thin film, fluid, and magnetic structures.
Linear bipolar DC magnet power supplies provide true 4-quadrant output, eliminating the need for external switching or operator intervention to reverse current polarity.
Water chillers for either 50 Hz or 60 Hz operation and in a variety of sizes and cooling capacities.