An innovative architecture for coordinating low-level measurements from DC to 100 kHz
The MeasureReady™ M81-SSM (Synchronous Source and Measure) system provides a confident and straightforward approach for advanced measurement applications. The M81 is designed to eliminate the complexity of multiple function-specific instrumentation
setups, combining the convenience of DC and AC sourcing with DC and AC measurement, including a lock‑in’s sensitivity and measurement performance.
This extremely low-noise simultaneous source and measure system ensures inherently synchronized measurements from 1 to 3 source channels and from 1 to 3 measure channels per half-rack instrument — while also being highly adaptable for a range of
material and device research applications.
Components of the M81-SSM
- Connect up to three source modules and up to three measure modules
- Exchange modules and adapt the configuration for each measurement
- All modules are capable of measuring with DC and AC to 100 kHz
- All modules are optimized for high precision and common reference and ground.
Flexible measurement capabilities
The M81-SSM provides DC and AC stimulus and measurement capabilities for characterizing materials and devices in cryogenic, room temperature, and high-temperature environments.
Choose a combination of differential current source and voltage measurement modules for low-resistance applications requiring a precise stimulus current and the noise-cancellation benefits of balanced (floating) sample connections. Or mix and match with
additional voltage source and current measurement modules for complex higher-impedance or gate-biasing applications where precise voltage control and sweeping test regimes are required.
Unlike a narrow-bandwidth DC system, these modules operate from very low frequencies to 100 kHz. You can select a measurement bandwidth to avoid 1/f noise and other bands where test environment noise is highest.
The system’s MeasureSync™ technology samples all sourcing and measurement channels at precisely the same time, enabling multiple DUTs to be tested under identical conditions so you can obtain consistent data.
The included MeasureLINK™ software provides configurable measurement scripts and loops to support a variety of applications. It facilitates easy integration with Lake Shore as well as third-party systems.
These combined capabilities make the M81‑SSM a superior solution for characterizing several test structures, including nanostructures, single- and multilayer atomic structures, MEMs, quantum structures, organic semiconductors, and superconducting materials.