Model 8425 DC Hall System with Cryogenic Probe Station

Model 8425 DC Hall System with Cryogenic Probe Station

Features of the Model 8425

  • A complete Hall effect measurement system using device probing under vacuum in a probe station
  • Supports a range of DC field Hall measurements—measure mobility on wafer-scale materials and structures as a function of temperature and field
  • DC fields to 2 T and resistances from 0.5 mΩ to 100 GΩ
  • Vary temperatures from 10 K to 400 K using closed-cycle refrigerator—no cryogen required
  • Includes intuitive 8400 Series software for easy system operation, data acquisition, and analysis
  • Supports exporting of data for multi-carrier analysis
  • 3-year standard warranty
Featuring patented* FastHall technology, the M91 fundamentally changes Hall effect characterization by eliminating applied magnetic field polarity switching. This results in faster, more accurate measurements, especially with high field superconducting magnets or low mobility materials.

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Non-destructive Hall measurement of wafer-scale materials in a tightly controlled cryogenic environment

Advancing materials research

Featuring the latest in Lake Shore Hall measurement capabilities, the Model 8425 is ideal for a number of applied physics, electrical engineering, materials research, and product R&D applications. Measure electronic and magneto-transport properties of novel materials, including:

  • III-V semiconductors—InP, InSb, InAs, GaN, GaP, GaSb, AIN-based devices, high-electron mobility transistors (HEMTs), heterojunction bipolar transistors
  • II-VI semiconductors—CdS, CdSe, ZnS, ZnSe, ZnTe, HgCdTe
  • Elemental semiconductors—Ge, Si on insulator devices (SOI), SiC, doped diamond SiGe-based devices (HBTs and FETs)
  • High-temperature superconductors
No dicing required for full wafer measurements

Direct and derived measurements as a function of field and temperature

  • Hall voltage
  • IV curve measurements
  • Resistance
  • Magnetoresistance
  • Magnetotransport
  • Hall coefficient
  • Hall mobility
  • Anomalous Hall effect (AHE)
  • Carrier type/concentration/density
More about the Model 8425 Model 8425 softwareOptions for the Model 8425